Features
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Benefits
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Electrical module signal measurement accuracy:
- Ultra-low system jitter (
- > 70GHz
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45 Gb/sec). |
Industry’s lowest system noise at all bandwidths:
- 600 µV max (450 µV typ.) @ 60 GHz
- 380 µV max (280 µV typ.) @ 30 GHz
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Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure. |
Up to 6 channels simultaneous acquisition atHigh fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. |
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. |
Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm. |
Superior acquisition throughput with up to 300 kS/s maximum sample rate. |
Reduced manufacturing or device characterization test-time by 4X with superior system throughput. |
Ability to place the samplers adjacent to the device under test (DUT). |
Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed. |
Independent calibrated channel de-skew. |
Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing. |